Datasheet

Electrical characteristics STM32F100xC, STM32F100xD, STM32F100xE
82/98 Doc ID 15081 Rev 7
Note: ADC accuracy vs. negative injection current: Injecting a negative current on any analog
input pins should be avoided as this significantly reduces the accuracy of the conversion
being performed on another analog input. It is recommended to add a Schottky diode (pin to
ground) to analog pins which may potentially inject negative currents.
Table 52. R
AIN
max for f
ADC
= 12 MHz
(1)
1. Guaranteed by design, not tested in production.
T
s
(cycles) t
S
(µs) R
AIN
max (kΩ)
1.5 0.125 0.4
7.5 0.625 5.9
13.5 1.125 11.4
28.5 2.375 25.2
41.5 3.45 37.2
55.5 4.625 50
71.5 5.96 NA
239.5 20 NA
Table 53. ADC accuracy - limited test conditions
(1)(2)
1. ADC DC accuracy values are measured after internal calibration.
2. Preliminary values.
Symbol Parameter Test conditions Typ Max Unit
ET Total unadjusted error f
PCLK2
= 24 MHz,
f
ADC
= 12 MHz, R
AIN
< 10 kΩ,
V
DDA
= 3 V to 3.6 V
V
REF+
= V
DDA
T
A
= 25 °C
Measurements made after
ADC calibration
±1.5 ±2.5
LSB
EO Offset error ±1 ±2
EG Gain error ±0.5 ±1.5
ED Differential linearity error ±1.5 ±2
EL Integral linearity error ±1.5 ±2
Table 54. ADC accuracy
(1) (2) (3)
1. ADC DC accuracy values are measured after internal calibration.
2. Better performance could be achieved in restricted V
DD
, frequency, V
REF
and temperature ranges.
3. Preliminary values.
Symbol Parameter Test conditions Typ Max Unit
ET Total unadjusted error
f
PCLK2
= 24 MHz,
f
ADC
= 12 MHz, R
AIN
< 10 kΩ,
V
DDA
= 2.4 V to 3.6 V
T
A
= Full operating range
Measurements made after
ADC calibration
±2 ±5
LSB
EO Offset error ±1.5 ±2.5
EG Gain error ±1.5 ±3
ED Differential linearity error ±1.5 ±2.5
EL Integral linearity error ±1.5 ±4.5