Datasheet

STM32F100x4, STM32F100x6, STM32F100x8, STM32F100xB Description
Doc ID 16455 Rev 7 21/88
2.2.23 DAC (digital-to-analog converter)
The two 12-bit buffered DAC channels can be used to convert two digital signals into two
analog voltage signal outputs. The chosen design structure is composed of integrated
resistor strings and an amplifier in noninverting configuration.
This dual digital Interface supports the following features:
● two DAC converters: one for each output channel
● up to 10-bit output
● left or right data alignment in 12-bit mode
● synchronized update capability
● noise-wave generation
● triangular-wave generation
● dual DAC channels’ independent or simultaneous conversions
● DMA capability for each channel
● external triggers for conversion
● input voltage reference V
REF+
Eight DAC trigger inputs are used in the STM32F100xx. The DAC channels are triggered
through the timer update outputs that are also connected to different DMA channels.
2.2.24 Temperature sensor
The temperature sensor has to generate a voltage that varies linearly with temperature. The
conversion range is between 2 V < V
DDA
< 3.6 V. The temperature sensor is internally
connected to the ADC1_IN16 input channel which is used to convert the sensor output
voltage into a digital value.
2.2.25 Serial wire JTAG debug port (SWJ-DP)
The ARM SWJ-DP Interface is embedded, and is a combined JTAG and serial wire debug
port that enables either a serial wire debug or a JTAG probe to be connected to the target.
The JTAG TMS and TCK pins are shared respectively with SWDIO and SWCLK and a
specific sequence on the TMS pin is used to switch between JTAG-DP and SW-DP.