Datasheet

Ordering information scheme SMP100MC
10/13 Doc ID 9699 Rev 5
Figure 18. Test circuit 3 for dynamic I
H
parameter
3 Ordering information scheme
Figure 19. Ordering information scheme
TEST PROCEDURE
1/ Adjust the current level at the I value by short circuiting the AK of the D.U.T.
2/ Fire the D.U.T. with a surge current
H
➔ I=
10 A, 10/1000 µs.
3/ The D.U.T. will come back off-state within 50 ms maximum.
PP
This is a GO-NOGO test which allows to confirm the holding current (I ) level in a
functional test circuit.
H
R
V
BAT
= - 48 V
Surge generator
D.U.T
SMP 100 MC - xxx
Trisil surface mount
Repetitive peak pulse current
Capacitance
Voltage
100 = 100A
MC = Micro capacitance
270 = 270V