Datasheet

M95640, M95320
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Table 24. AC Characteristics (M95320-W and M95640-W, Device Grade 6)
Note: 1. t
CH
+ t
CL
must never be lower than the shortest possible clock period, 1/f
C
(max).
2. Value guaranteed by characterization, not 100% tested in production.
3. Previous product version is identified by Process Identification letter ‘S’.
4. Current product version is identified by Process Identification letter ‘V’’.
5. New product version is identified by Process Identification letter ‘P’.
6. Preliminary Data.
Test conditions specified in Table 14. and Table 11.
Symbol Alt. Parameter
Previous
Product
Version
3
Current
Product
Version
4
New
Product
Version
5,6
Unit
Min. Max. Min. Max. Min. Max.
f
C
f
SCK
Clock Frequency D.C. 2 D.C. 5 D.C. 10 MHz
t
SLCH
t
CSS1
S Active Setup Time 200 90 30 ns
t
SHCH
t
CSS2
S Not Active Setup Time 200 90 30 ns
t
SHSL
t
CS
S Deselect Time 200 100 40 ns
t
CHSH
t
CSH
S Active Hold Time 200 90 30 ns
t
CHSL
S Not Active Hold Time 200 90 30 ns
t
CH
1
t
CLH
Clock High Time 200 90 40 ns
t
CL
1
t
CLL
Clock Low Time 200 90 40 ns
t
CLCH
2
t
RC
Clock Rise Time 1 1 2 µs
t
CHCL
2
t
FC
Clock Fall Time 1 1 2 µs
t
DVCH
t
DSU
Data In Setup Time 40 20 10 ns
t
CHDX
t
DH
Data In Hold Time 50 30 10 ns
t
HHCH
Clock Low Hold Time after HOLD not Active 140 70 30 ns
t
HLCH
Clock Low Hold Time after HOLD Active 90 40 30 ns
t
CLHL
Clock Low Set-up Time before HOLD Active 0 0 0 ns
t
CLHH
Clock Low Set-up Time before HOLD not
Active
000ns
t
SHQZ
2
t
DIS
Output Disable Time 250 100 40 ns
t
CLQV
t
V
Clock Low to Output Valid 150 60 40 ns
t
CLQX
t
HO
Output Hold Time 0 0 0 ns
t
QLQH
2
t
RO
Output Rise Time 100 50 40 ns
t
QHQL
2
t
FO
Output Fall Time 100 50 40 ns
t
HHQV
t
LZ
HOLD High to Output Valid 100 50 40 ns
t
HLQZ
2
t
HZ
HOLD Low to Output High-Z 250 100 40 ns
t
W
t
WC
Write Time 10 5 5 ms