Datasheet

DocID022580 Rev 4 37/47
M95160 M95160-W M95160-R M95160-DF DC and AC parameters
46
Table 18. AC characteristics (M95160-R or M95160-DF, device grade 6)
Test conditions specified in Table 9 or Table 10 and Table 11
(1)
Symbol Alt. Parameter Min. Max. Unit
f
C
f
SCK
Clock frequency D.C. 5 MHz
t
SLCH
t
CSS1
S active setup time 60 - ns
t
SHCH
t
CSS2
S not active setup time 60 - ns
t
SHSL
t
CS
S deselect time 90 - ns
t
CHSH
t
CSH
S active hold time 60 - ns
t
CHSL
S not active hold time 60 - ns
t
CH
(2)
t
CLH
Clock high time 80 - ns
t
CL
(2)
t
CLL
Clock low time 80 - ns
t
CLCH
(3)
t
RC
Clock rise time - 2 µs
t
CHCL
(3)
t
FC
Clock fall time - 2 µs
t
DVCH
t
DSU
Data in setup time 20 - ns
t
CHDX
t
DH
Data in hold time 20 - ns
t
HHCH
Clock low hold time after HOLD not active 60 - ns
t
HLCH
Clock low hold time after HOLD active 60 - ns
t
CLHL
Clock low set-up time before HOLD active 0 - ns
t
CLHH
Clock low set-up time before HOLD not active 0 - ns
t
SHQZ
(3)
t
DIS
Output disable time - 80 ns
t
CLQV
t
V
Clock low to output valid - 80 ns
t
CLQX
t
HO
Output hold time 0 - ns
t
QLQH
(3)
t
RO
Output rise time - 80 ns
t
QHQL
(3)
t
FO
Output fall time - 80 ns
t
HHQV
t
LZ
HOLD high to output valid - 80 ns
t
HLQZ
(3)
t
HZ
HOLD low to output high-Z - 80 ns
t
W
t
WC
Write time - 5 ms
1. If the application uses the M95160-R or M95160-DF devices at 2.5 V ≤ V
CC
≤ 5.5 V and -40 °C ≤ T
A
≤
+85 °C, please refer to Table 15: DC characteristics (M95160-W, device grade 6), rather than to the above
table.
2. t
CH
+ t
CL
must never be lower than the shortest possible clock period, 1/f
C
(max).
3. Characterized only, not tested in production.