Datasheet

DC and AC parameters M95128-W M95128-R M95128-DF
38/49 Doc ID 5798 Rev 16
Table 20. AC characteristics (M95128-R, device grade 6)
Test conditions specified in Tabl e 1 0 and Tab le 1 2
Symbol Alt. Parameter
Previous
products
(1)
C
L
≤ 100 pF
New products
(2)
Unit
V
CC
≥ 1.8V
C
L
≤ 100 pF
V
CC
≥ 2.5V
C
L
≤ 30 pF
V
CC
≥ 4.5V
C
L
≤ 30 pF
Min. Max. Min. Max. Min. Max. Min. Max.
f
C
f
SCK
Clock frequency 2 5 10 20 MHz
t
SLCH
t
CSS1
S active setup time 200 60 30 15 ns
t
SHCH
t
CSS2
S not active setup time 200 60 30 15 ns
t
SHSL
t
CS
S deselect time 200 90 40 20 ns
t
CHSH
t
CSH
S active hold time 200 60 30 15 ns
t
CHSL
S not active hold time 200 60 30 15 ns
t
CH
(3)
t
CLH
Clock high time 200 80 40 20 ns
t
CL
(3)
t
CLL
Clock low time 200 80 40 20 ns
t
CLCH
(4)
t
RC
Clock rise time 1 2 2 2 µs
t
CHCL
(4)
t
FC
Clock fall time 1 2 2 2 µs
t
DVCH
t
DSU
Data in setup time 40 20 10 5 ns
t
CHDX
t
DH
Data in hold time 50 20 10 10 ns
t
HHCH
Clock low hold time after HOLD
not active
140 60 30 15 ns
t
HLCH
Clock low hold time after HOLD
active
90 60 30 15 ns
t
CLHL
Clock low setup time before HOLD
active
0000ns
t
CLHH
Clock low setup time before HOLD
not active
0000ns
t
SHQZ
(4)
t
DIS
Output disable time 250 80 40 20 ns
t
CLQV
t
V
Clock low to output valid 150 80 40 20 ns
t
CLQX
t
HO
Output hold time 0 0 0 0 ns
t
QLQH
(4)
t
RO
Output rise time 100 20 20 10 ns
t
QHQL
(4)
t
FO
Output fall time 100 20 20 10 ns
t
HHQV
t
LZ
HOLD high to output valid 100 80 40 20 ns
t
HLQZ
(4)
t
HZ
HOLD low to output High-Z 250 80 40 20 ns
t
W
t
WC
Write time 5 5 5 5 ms
1. Previous products are identified by process letters A.
2. New products are the M95256 devices identified by process letter K.
3. t
CH
+ t
CL
must never be less than the shortest possible clock period, 1 / f
C
(max).
4. Characterized only, not tested in production.