Datasheet

DC and AC parameters M950x0-W M950x0-R M950x0-DF
38/45 DocID6512 Rev 12
Table 21. AC characteristics (M950x0-R, device grade 6)
Not recommended for new designs, for new designs refer to Table 19
Test conditions specified in Table 10 and Table 12
(1)
1. The test flow guarantees the AC parameter values defined in this table (when V
CC
= 1.8 V) and the AC
parameter values defined in Table 18: AC characteristics (M950x0-W, device grade 6) (when V
CC
= 2.5 or
when V
CC
= 5.0 V).
Symbol Alt. Parameter Min. Max. Unit
f
C
f
SCK
Clock frequency D.C. 5 MHz
t
SLCH
t
CSS1
S active setup time 90 - ns
t
SHCH
t
CSS2
S not active setup time 90 - ns
t
SHSL
t
CS
S deselect time 100 - ns
t
CHSH
t
CSH
S active hold time 90 - ns
t
CHSL
S not active hold time 90 - ns
t
CH
(2)
2. t
CH
+ t
CL
must never be less than the shortest possible clock period, 1 / f
C
(max)
t
CLH
Clock high time 90 - ns
t
CL
(1)
t
CLL
Clock low time 90 - ns
t
CLCH
(3)
3. Value guaranteed by characterization, not 100% tested in production.
t
RC
Clock rise time - 1 µs
t
CHCL
(2)
t
FC
Clock fall time - 1 µs
t
DVCH
t
DSU
Data in setup time 20 - ns
t
CHDX
t
DH
Data in hold time 30 - ns
t
HHCH
Clock low hold time after HOLD not active 70 - ns
t
HLCH
Clock low hold time after HOLD active 40 - ns
t
CLHL
Clock low setup time before HOLD active 0 - ns
t
CLHH
Clock low setup time before HOLD not active 0 - ns
t
SHQZ
(2)
t
DIS
Output disable time - 100 ns
t
CLQV
t
V
Clock low to output valid - 80 ns
t
CLQX
t
HO
Output hold time 0 - ns
t
QLQH
(2)
t
RO
Output rise time - 50 ns
t
QHQL
(2)
t
FO
Output fall time - 50 ns
t
HHQV
t
LZ
HOLD high to output valid - 50 ns
t
HLQZ
(2)
t
HZ
HOLD low to output high-Z - 100 ns
t
W
t
WC
Write time - 5 ms