Datasheet

DC and AC parameters M950x0-W M950x0-R M950x0-DF
36/45 DocID6512 Rev 12
Table 19. AC characteristics (M950x0-R or M95040-DF, device grade 6)
(1)
1. The timing values described in this table are recommended for new designs.
Test conditions specified in Table 10 or Table 11 and Table 12
(2)
2. If the application uses the M950x0-R or M95040-DF devices at 2.5 V  V
CC
 5.5 V and -40 °C  T
A

+85 °C, please refer to Table 16: DC characteristics (M950x0-W, device grade 6), rather than to the above
table.
Symbol Alt. Parameter Min. Max. Unit
f
C
f
SCK
Clock frequency D.C. 5 MHz
t
SLCH
t
CSS1
S active setup time 60 - ns
t
SHCH
t
CSS2
S not active setup time 60 - ns
t
SHSL
t
CS
S deselect time 90 - ns
t
CHSH
t
CSH
S active hold time 60 - ns
t
CHSL
S not active hold time 60 - ns
t
CH
(3)
3. t
CH
+ t
CL
must never be lower than the shortest possible clock period, 1/f
C
(max).
t
CLH
Clock high time 80 - ns
t
CL
(3)
t
CLL
Clock low time 80 - ns
t
CLCH
(4)
4. Characterized only, not tested in production.
t
RC
Clock rise time - 2 µs
t
CHCL
(4)
t
FC
Clock fall time - 2 µs
t
DVCH
t
DSU
Data in setup time 20 - ns
t
CHDX
t
DH
Data in hold time 20 - ns
t
HHCH
Clock low hold time after HOLD not active 60 - ns
t
HLCH
Clock low hold time after HOLD active 60 - ns
t
CLHL
Clock low set-up time before HOLD active 0 - ns
t
CLHH
Clock low set-up time before HOLD not active 0 - ns
t
SHQZ
(4)
t
DIS
Output disable time - 80 ns
t
CLQV
t
V
Clock low to output valid - 80 ns
t
CLQX
t
HO
Output hold time 0 - ns
t
QLQH
(4)
t
RO
Output rise time - 80 ns
t
QHQL
(4)
t
FO
Output fall time - 80 ns
t
HHQV
t
LZ
HOLD high to output valid - 80 ns
t
HLQZ
(4)
t
HZ
HOLD low to output high-Z - 80 ns
t
W
t
WC
Write time - 5 ms