Datasheet

DC and AC parameters M950x0-W M950x0-R M950x0-DF
32/45 DocID6512 Rev 12
Table 13. Cycling performance
(1)
1. Cycling performance for products identified by process letter K.
Symbol Parameter Test conditions Min. Max. Unit
Ncycle Write cycle endurance
TA  25 °C,
V
CC
(min) < V
CC
< V
CC
(max)
- 4,000,000
Write cycle
TA = 85 °C,
V
CC
(min) < V
CC
< V
CC
(max)
- 1,200,000
Table 14. Memory cell data retention
(1)
1. For products identified by process letter K. The data retention behavior is checked in production, while the
200-year limit is defined from characterization and qualification results.
Parameter Test conditions Min. Unit
Data retention TA = 55 °C 200 Year
Table 15. Capacitance
(1)
1. Sampled only, not 100% tested, at TA=25 °C and a frequency of 5 MHz.
Symbol Parameter Test condition Min. Max. Unit
C
OUT
Output capacitance (Q) V
OUT
= 0 V - 8 pF
C
IN
Input capacitance (D) V
IN
= 0 V - 8 pF
Input capacitance (other pins) V
IN
= 0 V - 6 pF