Datasheet

LCDP1521 Test circuits
Doc ID 8627 Rev 4 5/12
3 Test circuits
3.1 Functional holding current (I
H
): go no-go test
Figure 4. Functional holding current (I
H
) test circuit: go no-go test
This is a go no-go test, which confirms the holding current (IH) level in a functional test circuit.
3.1.1 Test procedure
● Adjust the current level at the I
H
value by short circuiting the D.U.T.
● Fire the D.U.T. with a surge current: I
PP
= 10 A, 10/1000 µs.
The D.U.T. will come back to the off-state within a duration of 50 ms max.
3.2 Test circuit for V
FP
and V
DGL
parameters
Figure 5. Test circuit for V
FP
and V
DGL
parameters
R
V
BAT
= -100 V
Surge generator
D.U.T
C2
R4
R3
TIP
RING
GND
V
P
R2
R1
L
C1
(V
P
is defined in unloaded condition)