Datasheet

STM8S105xx
Electrical characteristics
10.3.12.4 Absolute maximum ratings (electrical sensitivity)
Based on two different tests (ESD and LU) using specific measurement methods, the
product is stressed in order to determine its performance in terms of electrical sensitivity.
For more details, refer to the application note AN1181.
10.3.12.5 Electrostatic discharge (ESD)
Electrostatic discharges (3 positive then 3 negative pulses separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts*(n+1) supply pin). This test
conforms to the JESD22-A114A/A115A standard. For more details, refer to the application
note AN1181.
Table 50: ESD absolute maximum ratings
Symbol Ratings Conditions Class Maximum
value
(1)
Unit
V
ESD(HBM)
Electrostatic discharge
voltage (Human body model)
T
A
= +25°C, conforming
to JESD22-A114
A 2000 V
V
ESD(CDM)
Electrostatic discharge
voltage (Charge device
model)
T
A
=+25°C, conforming
to JESD22-C101
IV 1000 V
Notes:
(1)
Data based on characterization results, not tested in production
10.3.12.6 Static latch-up
Two complementary static tests are required on 10 parts to assess the latch-up
performance:
• A supply overvoltage (applied to each power supply pin)
• A current injection (applied to each input, output and configurable I/O pin) is performed
on each sample.
This test conforms to the EIA/JESD 78 IC latch-up standard. For more details, refer to the
application note AN1181.
Table 51: Electrical sensitivities
Symbol Parameter Conditions Class
(1)
LU Static latch-up class T
A
= +25 °C A
T
A
= +85 °C A
T
A
= +125 °C A
Notes:
(1)
Class description: A Class is a STMicroelectronics internal specification. All limits are higher than JEDEC
specifications, that means when a device belongs to class A it exceeds JEDEC standard. B class strictly covers all
the JEDEC criteria (international standard).
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