Datasheet

Electrical characteristics STM32L072xx
92/149 DocID027100 Rev 4
6.3.11 Electrical sensitivity characteristics
Based on three different tests (ESD, LU) using specific measurement methods, the device is
stressed in order to determine its performance in terms of electrical sensitivity.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts × (n+1) supply pins). This test
conforms to the ANSI/JEDEC standard.
Static latch-up
Two complementary static tests are required on six parts to assess the latch-up
performance:
• A supply overvoltage is applied to each power supply pin
• A current injection is applied to each input, output and configurable I/O pin
These tests are compliant with EIA/JESD 78A IC latch-up standard.
Table 57. ESD absolute maximum ratings
Symbol Ratings Conditions Class
Maximum
value
(1)
1. Guaranteed by characterization results.
Unit
V
ESD(HBM)
Electrostatic discharge
voltage (human body model)
T
A
= +25 °C,
conforming to
ANSI/JEDEC JS-001
22000
V
V
ESD(CDM)
Electrostatic discharge
voltage (charge device
model)
T
A
= +25 °C,
conforming to
ANSI/ESD STM5.3.1.
C4 500
Table 58. Electrical sensitivities
Symbol Parameter Conditions Class
LU Static latch-up class T
A
= +125 °C conforming to JESD78A II level A
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