Datasheet

Electrical characteristics STM32L011x3/4
74/119 DocID027973 Rev 5
6.3.12 I/O current injection characteristics
As a general rule, current injection to the I/O pins, due to external voltage below V
SS
or
above V
DD
(for standard pins) should be avoided during normal product operation.
However, in order to give an indication of the robustness of the microcontroller in cases
when abnormal injection accidentally happens, susceptibility tests are performed on a
sample basis during device characterization.
Functional susceptibility to I/O current injection
While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into
the I/O pin, one at a time, the device is checked for functional failures.
The failure is indicated by an out of range parameter: ADC error above a certain limit (higher
than 5 LSB TUE), out of conventional limits of induced leakage current on adjacent pins (out
of –5 µA/+0 µA range), or other functional failure (for example reset occurrence oscillator
frequency deviation).
The test results are given in the Table 49.
Table 48. Electrical sensitivities
Symbol Parameter Conditions Class
LU Static latch-up class T
A
= +125 °C conforming to JESD78A II level A
Table 49. I/O current injection susceptibility
Symbol Description
Functional susceptibility
Unit
Negative
injection
Positive
injection
I
INJ
Injected current on BOOT0 -0 NA
(1)
1. Current injection is not possible.
mAInjected current on all FT pins -5
(2)
2. It is recommended to add a Schottky diode (pin to ground) to analog pins which may potentially inject
negative currents.
NA
(1)
Injected current on any other pin -5
(2)
+5
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