Datasheet

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STM32F303x6/x8 Electrical characteristics
101
6.3.13 I/O current injection characteristics
As a general rule, current injection to the I/O pins, due to external voltage below V
SS
or
above V
DD
(for standard, 3 V-capable I/O pins) should be avoided during normal product
operation. However, to give an indication of the robustness of the microcontroller in cases
when abnormal injection accidentally happens, susceptibility tests are performed on a
sample basis during device characterization.
Functional susceptibility to I/O current injection
While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into
the I/O pin, one at a time, the device is checked for functional failures.
The failure is indicated by an out of range parameter: ADC error above a certain limit (higher
than 5 LSB TUE), out of conventional limits of induced leakage current on adjacent pins (out
of –5 µA/+0 µA range), or other functional failure (for example reset occurrence or oscillator
frequency deviation). The test results are given in
Table 51: I/O current injection
susceptibility.
Table 51. I/O current injection susceptibility
Symbol Description
Functional susceptibility
Unit
Negative
injection
Positive
injection
I
INJ
Injected current on BOOT0 – 0
NA (Injection
is not possi-
ble)
mA
Injected current on PC0, PC1, PC2, PC3 (TTa pins)
and PF1 pin (FT pin)
-0 +5
Injected current on PA0, PA1, PA2, PA3, PA4, PA5,
PA6, PA7, PC4, PC5, PB0, PB1, PB2, PB12, PB13,
PB14, PB15 with induced leakage current on other
pins from this group less than -100 µA or more than
+900 µA
-5 +5
Injected current on PB11, other TT, FT, and FTf pins – 5
Injection is
not possible
Injected current on all other TC, TTa and RESET
pins
– 5 +5
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