Datasheet

DS9118 Rev 14 63/149
STM32F303xB STM32F303xC Electrical characteristics
125
6.3.4 Embedded reference voltage
The parameters given in Table 28 are derived from tests performed under ambient
temperature and V
DD
supply voltage conditions summarized in Table 24.
6.3.5 Supply current characteristics
The current consumption is a function of several parameters and factors such as the
operating voltage, ambient temperature, I/O pin loading, device software configuration,
operating frequencies, I/O pin switching rate, program location in memory and executed
binary code.
The current consumption is measured as described in Figure 12: Current consumption
measurement scheme.
All Run-mode current consumption measurements given in this section are performed with a
reduced code that gives a consumption equivalent to CoreMark code.
Typical and maximum current consumption
The MCU is placed under the following conditions:
All I/O pins are in input mode with a static value at V
DD
or V
SS
(no load)
All peripherals are disabled except when explicitly mentioned
The Flash memory access time is adjusted to the f
HCLK
frequency (0 wait state from 0
to 24 MHz,1 wait state from 24 to 48 MHz and 2 wait states from 48 to 72 MHz)
Prefetch in ON (reminder: this bit must be set before clock setting and bus prescaling)
When the peripherals are enabled f
PCLK2
= f
HCLK
and f
PCLK1
= f
HCLK/2
When f
HCLK
> 8 MHz, the PLL is ON and the PLL input is equal to HSI/2 (4 MHz) or
HSE (8 MHz) in bypass mode.
Table 28. Embedded internal reference voltage
Symbol Parameter Conditions Min Typ Max Unit
V
REFINT
Internal reference voltage
–40 °C < T
A
< +105 °C 1.2 1.23 1.25 V
–40 °C < T
A
< +85 °C 1.2 1.23 1.24
(1)
1. Guaranteed by characterization results.
V
T
S_vrefint
ADC sampling time when
reading the internal
reference voltage
-2.2--µs
V
RERINT
Internal reference voltage
spread over the
temperature range
V
DD
= 3 V ±10 mV - -
10
(2)
2. Guaranteed by design.
mV
T
Coeff
Temperature coefficient - - -
100
(2)
ppm/°C
Table 29. Internal reference voltage calibration values
Calibration value name Description Memory address
V
REFINT_CAL
Raw data acquired at
temperature of 30 °C
V
DDA
= 3.3 V
0x1FFF F7BA - 0x1FFF F7BB
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