Datasheet

Electrical characteristics STM32F302x6 STM32F302x8
84/138 DocID025147 Rev 7
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the NRST pin or the Oscillator pins for 1
second.
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring (see application note AN1015).
Electromagnetic Interference (EMI)
The electromagnetic field emitted by the device are monitored while a simple application is
executed (toggling 2 LEDs through the I/O ports). This emission test is compliant with
IEC
61967-2 standard which specifies the test board and the pin loading.
6.3.12 Electrical sensitivity characteristics
Based on three different tests (ESD, LU) using specific measurement methods, the device is
stressed in order to determine its performance in terms of electrical sensitivity.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts × (n+1) supply pins). This test
conforms to the JESD22-A114/C101 standard.
Table 49. EMI characteristics
Symbol Parameter Conditions
Monitored
frequency band
Max vs. [f
HSE
/f
HCLK
]
Unit
8/72 MHz
S
EMI
Peak level
V
DD
= 3.3 V, T
A
= 25 °C,
LQFP64 package
compliant with IEC
61967-2
0.1 to 30 MHz 5
dBµV30 to 130 MHz 6
130 MHz to 1GHz 28
SAE EMI Level 4 -
Table 50. ESD absolute maximum ratings
Symbol Ratings Conditions Packages Class
Maximum
value
(1)
Unit
V
ESD(HBM)
Electrostatic discharge voltage
(human body model)
T
A
= +25 °C, conforming
to JESD22-A114
All 2 2000 V
V
ESD(CDM)
Electrostatic discharge voltage
(charge device model)
T
A
= +25 °C, conforming
to ANSI/ESD STM5.3.1
LQFP64,
WLCSP49
C3 250
V
All other C4 500
1. Guaranteed by characterization results.
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