Datasheet

DocID15274 Rev 10 57/108
STM32F105xx, STM32F107xx Electrical characteristics
107
operation. However, in order to give an indication of the robustness of the microcontroller in
cases when abnormal injection accidentally happens, susceptibility tests are performed on a
sample basis during device characterization.
Functional susceptibility to I/O current injection
While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into
the I/O pin, one at a time, the device is checked for functional failures.
The failure is indicated by an out of range parameter: ADC error above a certain limit (>5
LSB TUE), out of spec current injection on adjacent pins or other functional failure (for
example reset, oscillator frequency deviation).
The test results are given in Table 35
5.3.13 I/O port characteristics
General input/output characteristics
Unless otherwise specified, the parameters given in Table 36 are derived from tests
performed under the conditions summarized in Table 9. All I/Os are CMOS and TTL
compliant.
Table 35. I/O current injection susceptibility
Symbol Description
Functional susceptibility
Unit
Negative
injection
Positive
injection
I
INJ
Injected current on OSC_IN32,
OSC_OUT32, PA4, PA5, PC13
-0 +0
mA
Injected current on all FT pins -5 +0
Injected current on any other pin -5 +5
Table 36. I/O static characteristics
Symbol Parameter Conditions Min Typ Max Unit
V
IL
Standard IO input low
level voltage
- –0.3 - 0.28*(V
DD
-2 V)+0.8 V V
IO FT
(1)
input low level
voltage
- –0.3 - 0.32*(V
DD
-2V)+0.75 V V
V
IH
Standard IO input high
level voltage
- 0.41*(V
DD
-2 V)+1.3 V - V
DD
+0.3 V
IO FT
(1)
input high level
voltage
V
DD
> 2 V
0.42*(V
DD
-2 V)+1 V -
5.5
V
V
DD
≤ 2 V 5.2
V
hys
Standard IO Schmitt
trigger voltage
hysteresis
(2)
- 200 - - mV
IO FT Schmitt trigger
voltage hysteresis
(2)
- 5% V
DD
(3)
- - mV
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