Datasheet

DS5792 Rev 13 85/143
STM32F103xC, STM32F103xD, STM32F103xE Electrical characteristics
135
Figure 41. NAND controller waveforms for common memory write access
Table 40. Switching characteristics for NAND Flash read and write cycles
(1)
1. C
L
= 15 pF.
Symbol Parameter Min Max Unit
t
d(D-NWE)
(2)
2. Guaranteed by characterization results.
FSMC_D[15:0] valid before FSMC_NWE high 5t
HCLK
+ 12 - ns
t
w(NOE)
(2)
FSMC_NWE low width 4t
HCLK-1.5
4t
HCLK+1.5
ns
t
su(D-NOE)
(2)
FSMC_D[15:0] valid data before
FSMC_NOE
high
25 -
ns
t
h(NOE-D)
(2)
FSMC_D[15:0] valid data after FSMC_NOE high 7 - -
t
w(NWE)
(2)
FSMC_NWE low width 4t
HCLK-1
4t
HCLK+1
ns
t
v(NWE-D)
(2)
FSMC_NWE low to FSMC_D[15:0] valid - 0 ns
t
h(NWE-D)
(2)
FSMC_NWE high to FSMC_D[15:0] invalid 2t
HCLK
+ 4 - ns
t
d(ALE-NWE)
(3)
3. Guaranteed by design.
FSMC_ALE valid before FSMC_NWE low - 3t
HCLK
+ 1.5 ns
t
h(NWE-ALE)
(3)
FSMC_NWE high to FSMC_ALE invalid 3t
HCLK
+ 4.5 - ns
t
d(ALE-NOE)
(3)
FSMC_ALE valid before FSMC_NOE low - 3t
HCLK
+ 2 ns
t
h(NOE-ALE)
(3)
FSMC_NWE high to FSMC_ALE invalid 3t
HCLK
+ 4.5 - ns
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