Datasheet

Electrical characteristics STM32F051x4 STM32F051x6 STM32F051x8
68/121 DocID022265 Rev 6
Software recommendations
The software flowchart must include the management of runaway conditions such as:
• Cor
rupted program counter
• Unexpected reset
• Critical Data corruption (for example control registers)
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by
manually forcing a low state on the NRST pin or the Oscillator pins for 1
second.
To complete these trials, ESD stress can be applied d
irectly on the device, over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring (see application note AN1015).
Electromagnetic Interference (EMI)
The electromagnetic field emitted by the device are monitored while a simple application is
executed (toggling 2 LEDs through the I/O ports). This emission test is compliant with
IEC 61967-2 standard which specifies the test board and the pin loading.
6.3.12 Electrical sensitivity characteristics
Based on three different tests (ESD, LU) using specific measurement methods, the device is
stressed in order to determine its performance in terms of electrical sensitivity.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts × (n+1) supply pins). This test
conforms to the JESD22-A114/C101 standard.
Table 44. EMI characteristics
Symbol Parameter Conditions
Monitored
frequency band
Max vs. [f
HSE
/f
HCLK
]
Unit
8/48 MHz
S
EMI
Peak level
V
DD
= 3.6 V, T
A
= 25 °C,
LQFP64 package
compliant with
IEC 61967-2
0.1 to 30 MHz -3
dBµV30 to 130 MHz 28
130 MHz to 1 GHz 23
EMI Level 4 -
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