Datasheet

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STM32F051x4 STM32F051x6 STM32F051x8 Electrical characteristics
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6.3.4 Embedded reference voltage
The parameters given in Table 24 are derived from tests performed under the ambient
temperature and supply voltage conditions summarized in Table 20: General operating
conditions.
6.3.5 Supply current characteristics
The current consumption is a function of several parameters and factors such as the
operating voltage, ambient temperature, I/O pin loading, device software configuration,
operating frequencies, I/O pin switching rate, program location in memory and executed
binary code.
The current consumption is measured as described in Figure 14: Current consumption
measurement scheme.
All Run-mode current consumption measurements g
iven in this section are performed with a
reduced code that gives a consumption equivalent to CoreMark code.
V
PVD6
PVD threshold 6
Rising edge 2.66 2.78 2.9 V
Falling edge 2.56 2.68 2.8 V
V
PVD7
PVD threshold 7
Rising edge 2.76 2.88 3 V
Falling edge 2.66 2.78 2.9 V
V
PVDhyst
(1)
PVD hysteresis - 100 - mV
I
DD(PVD)
PVD current consumption - 0.15 0.26
(1)
µA
1. Guaranteed by design, not tested in production.
Table 23. Programmable voltage detector characteristics (continued)
Symbol Parameter Conditions Min Typ Max Unit
Table 24. Embedded internal reference voltage
Symbol Parameter Conditions Min Typ Max Unit
V
REFINT
Internal reference voltage –40 °C < T
A
< +105 °C 1.16 1.2 1.25 V
t
START
ADC_IN17 buffer startup
time
---10
(1)
µs
t
S_vrefint
ADC sampling time when
reading the internal
reference voltage
-
4
(1)
1. Guaranteed by design, not tested in production.
-- µs
ΔV
REFINT
Internal reference voltage
spread over the
temperature range
V
DDA
= 3 V - -
10
(1)
mV
T
Coeff
Temperature coefficient -
- 100
(1)
-
100
(1)
ppm/°C
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