Datasheet

ST7LITE0xY0, ST7LITESxY0
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EMC CHARACTERISTICS (Cont’d)
13.7.3 Absolute Maximum Ratings (Electrical
Sensitivity)
Based on two different tests (ESD and LU) using
specific measurement methods, the product is
stressed in order to determine its performance in
terms of electrical sensitivity.
13.7.3.1 Electro-Static Discharge (ESD)
Electro-Static Discharges (a positive then a nega-
tive pulse separated by 1 second) are applied to
the pins of each sample according to each pin
combination. The sample size depends on the
number of supply pins in the device (3 parts*(n+1)
supply pin). This test conforms to the JESD22-
A114A standard.
ESD absolute maximum ratings
Notes:
1. Data based on characterization results, not tested in production.
13.7.3.2 Static Latch-Up
■ LU: Two complementary static tests are
required on 10 parts to assess the latch-up
performance. A supply overvoltage (applied to
each power supply pin) and a current injection
(applied to each input, output and configurable I/
O pin) are performed on each sample. These
test are compliant with the EIA/JESD 78 IC
latch-up standard.
Electrical Sensitivities
Note:
1. Class description: A Class is an STMicroelectronics internal specification. All its limits are higher than the JEDEC spec-
ifications, that means when a device belongs to Class A it exceeds the JEDEC standard. B Class strictly covers all the
JEDEC criteria (international standard).
Symbol Ratings Conditions Maximum value
1)
Unit
V
ESD(HBM)
Electro-static discharge voltage
(Human Body Model)
T
A
=+25°C
conforming to JESD22-A114
4000 V
Symbol Parameter Conditions Class
1)
LU Static latch-up class
T
A
=+25°C
conforming to JESD78A
II level A
1