Datasheet

ST6200C/ST6201C/ST6203C
73/100
10.7 EMC CHARACTERISTICS
Susceptibility tests are performed on a sample ba-
sis during product characterization.
10.7.1 Functional EMS
(Electro Magnetic Susceptibility)
Based on a simple running application on the
product (toggling 2 LEDs through I/O ports), the
product is stressed by two electro magnetic events
until a failure occurs (indicated by the LEDs).
■ ESD: Electro-Static Discharge (positive and
negative) is applied on all pins of the device until
a functional disturbance occurs. This test
conforms with the IEC 1000-4-2 standard.
■ FTB: A Burst of Fast Transient voltage (positive
and negative) is applied to V
DD
and V
SS
through
a 100pF capacitor, until a functional disturbance
occurs. This test conforms with the IEC 1000-4-
4 standard.
A device reset allows normal operations to be re-
sumed.
Notes:
1. Data based on characterization results, not tested in production.
2. The suggested 10 µF and 0.1 µF decoupling capacitors on the power supply lines are proposed as a good price vs.
EMC performance tradeoff. They have to be put as close as possible to the device power supply pins. Other EMC rec-
ommendations are given in other sections (I/Os, RESET, OSCx pin characteristics).
Figure 50. EMC Recommended Star Network Power Supply Connection
2)
Symbol Parameter Conditions Neg
1)
Pos
1)
Unit
V
FESD
Voltage limits to be applied on any I/O pin
to induce a functional disturbance
V
DD
=
5V, T
A
=
+25°C, f
OSC
=
8MHz
conforms to IEC 1000-4-2
-2 2
kV
V
FFTB
Fast transient voltage burst limits to be ap-
plied through 100pF on V
DD
and V
DD
pins
to induce a functional disturbance
V
DD
=
5V, T
A
=
+25°C, f
OSC
=
8MHz
conforms to IEC 1000-4-4
-2.5 3
V
DD
V
SS
0.1 µF10 µF
V
DD
ST62XX
POWER
SUPPLY
SOURCE
ST6
DIGITAL NOISE
FILTERING
(close to the MCU)
1