Datasheet

DocID025056 Rev 6 11/53
LIS2DH12 Mechanical and electrical specifications
53
2.2 Temperature sensor characteristics
@ Vdd = 2.5 V, T = 25 °C unless otherwise noted
(b)
TCOff
Zero-g level change
vs. temperature
Max delta from 25 °C ±0.5 mg/°C
An
Acceleration noise
density
FS bit set to 00, High-Resolution
mode (Table 10), ODR > 1300 Hz
220 μg/√Hz
Vst
Self-test
output change
(4) (5) (6)
FS bit set to 00
X-axis; Normal mode
17 360 LSb
FS bit set to 00
Y-axis; Normal mode
17 360 LSb
FS bit set to 00
Z-axis; Normal mode
17 360 LSb
Top
Operating
temperature range
-40 +85 °C
1. Typical specifications are not guaranteed.
2. Verified by wafer level test and measurement of initial offset and sensitivity.
3. Typical zero-g level offset value after factory calibration test at socket level.
4. The sign of “Self-test output change” is defined by the ST bits in CTRL_REG4 (23h), for all axes.
5.
“Self-test output change” is defined as the absolute value of:
OUTPUT[LSb]
(Self test enabled)
- OUTPUT[LSb]
(Self test disabled)
. 1LSb = 4 mg at 10-bit representation, ±2 g full scale
6. After enabling the self-test, correct data is obtained after two samples (low-power mode / normal mode) or after eight
samples (high-resolution mode).
Table 4. Mechanical characteristics (continued)
Symbol Parameter Test conditions Min. Typ.
(1)
Max. Unit
b. The product is factory calibrated at 2.5 V. Temperature sensor operation is guaranteed in the range 2 V - 3.6 V.
Table 5. Temperature sensor characteristics
Symbol Parameter Min. Typ.
(1)
Max. Unit
TSDr Temperature sensor output change vs. temperature 1 digit/°C
(2)
TODR Temperature refresh rate ODR
(3)
Hz
Top Operating temperature range -40 +85 °C
1. Typical specifications are not guaranteed.
2. 8-bit resolution.
3. Refer to Table 31.