User Guide

Figure 5. Page EEPROM data retention time vs temperature (cycled page)
At average 40°C, if the page is cycled, the data programmed in a page EEPROM product can be read for 10
years.
3.3 Data retention qualification method
Data retention qualification procedure for page EEPROM checks that the data remain readable with a safe
programming level. The qualification method consists in storing the part in an oven at 150°C during 3000 hours
with no DC voltage on pin VCC. Then the part content is checked.
The data retention follows an Arrhenius law, this permits to extrapolate, from the different qualification tests
performed at different temperatures, the page EEPROMs data retention performance. These limits are above the
safe value defined in datasheets.
3.4 Application data retention strategy
To evaluate the data retention, it is recommended to evaluate the amount of time during which the end application
remains within a same temperature range. A good data retention evaluation should:
• Define the time (in years) during which the Page EEPROM remain inside each temperature range (that is a
typical temperature profile of the end application)
• Estimate the data retention value for each temperature range with the following equation:
  

 
 
  (1)
If the result of the equation is inferior or equal to 1, it means the application data retention time respects the
maximum data retention capability of the page EEPROM products.
Example
An application is running for 14 years at 30°C and 6 years at 50°C. The application does not cycle pages
intensively and its lifetime is 20 years. The equation helps the user to determine if the maximum data capability is
reached with the application temperature range.
AN5866
Data retention qualification method
AN5866 - Rev 1
page 7/14