Data Sheet

PRELIMINARY
VS1063a Datasheet
10 OPERATION
10.12.4 Memory Test
Memory test mode is initialized with the 8-byte sequence 0x4D 0xEA 0x6D 0x54 0 0 0 0. After
this sequence, wait for 1100000 clock cycles. The result can be read from the SCI register
SCI_HDAT0, and ’one’ bits are interpreted as follows:
Bit(s) Mask Meaning
15 0x8000 Test finished
14:10 Unused
9 0x0200 Mux test succeeded
8 0x0100 Good MAC RAM
7 0x0080 Good I RAM
6 0x0040 Good Y RAM
5 0x0020 Good X RAM
4 0x0010 Good I ROM 1
3 0x0008 Good I ROM 2
2 0x0004 Good Y ROM
1 0x0002 Good X ROM 1
0 0x0001 Good X ROM 2
0x83ff All ok
Memory tests overwrite the current contents of the RAM memories.
10.12.5 New Sine and Sweep Tests
A more frequency-accurate sine test can be started and controlled from SCI. SCI_AICTRL0 and
SCI_AICTRL1 set the sine frequencies for left and right channel, respectively. These registers,
volume (SCI_VOL), and samplerate (SCI_AUDATA) can be set before or during the test. Write
0x4020 to SCI_AIADDR to start the test.
SCI_AICTRLn can be calculated from the desired frequency and DAC samplerate by:
SCI_AICT RLn = F
sin
× 65536/F
s
The maximum value for SCI_AICTRLn is 0x8000U. For the best S/N ratio for the generated
sine, three LSb’s of the SCI_AICTRLn should be zero. The resulting frequencies F
sin
can be
calculated from the DAC samplerate F
s
and SCI_AICTRL0 / SCI_AICTRL1 using the following
equation.
F
sin
= SCI_AICT RLn × F
s
/65536
Sine sweep test can be started by writing 0x4022 to SCI_AIADDR.
Both these tests use the normal audio path, thus also SCI_BASS, differential output mode, and
EarSpeaker settings have an effect.
Version: 0.42, 2011-11-24 77