Data Sheet

MPU-9250 Product Specification
Document Number: PS-MPU-9250A-01
Revision: 1.0
Release Date: 01/17/2014
11 Reliability
11.1 Qualification Test Policy
InvenSense’s products complete a Qualification Test Plan before being released to production. The
Qualification Test Plan for the MPU-9250 followed the JEDE C JESD 47I Standard, “Stress-Test-Driven
Qualification of Integrated Circuits,” with the individual tests described below.
11.2 Qualification Test Plan
Accelerated Life Tests
TEST
Method/Condition
Lot
Quantity
Sample
/ Lot
Acc /
Reject
Criteria
(HTOL/LFR)
High Temperature Operating Life
JEDEC JESD22-A108D
Dynamic, 3.63V biased, Tj>125°C
[read-points: 168, 500, 1000 hours]
3
77
(0/1)
(HAST)
Highly Accelerated Stress Test
(1)
JEDEC JESD22-A118A
Condition A, 130°C, 85%RH, 33.3 psia., unbiased
[read-point: 96 hours]
3
77
(0/1)
(HTS)
High Temperature Storage Life
JEDEC JESD22-A103D
Condition A, 125°C Non-Bias Bake
[read-points: 168, 500, 1000 hours]
3
77
(0/1)
Device Component Level Tests
TEST
Method/Condition
Lot
Quantity
Sample
/ Lot
Acc /
Reject
Criteria
(ESD-HBM)
ESD-Human Body Model
JEDEC JS-001-2012
(2KV)
1
3
(0/1)
(ESD-MM)
ESD-Machine Model
JEDEC JESD22-A115C
(250V)
1
3
(0/1)
(ESD-CDM)
ESD-Charged Device Model
JEDEC JESD22-C101E
(500V)
1
3
(0/1)
(LU)
Latch Up
JEDEC JESD-78D
Class II (2), 125°C; ±100mA
1.5X Vdd Over-voltage
1
6
(0/1)
(MS)
Mechanical Shock
JEDEC JESD22-B104C, Mil-Std-883, Method
2002.5 Cond. E, 10,000g’s, 0.2ms,
±X, Y, Z – 6 directions, 5 times/direction
3
5
(0/1)
(VIB)
Vibration
JEDEC JESD22-B103B
Variable Frequency (random), Cond. B, 5-500Hz,
X, Y, Z – 4 times/direction
1
5
(0/1)
(TC)
Temperature Cycling
(1)
JEDEC JESD22-A104D
Condition G [-40°C to +125°C], Soak Mode 2 [5’]
[read-Point: 1000 cycles]
3
77
(0/1)
(1) Tests are preceded by MSL3 Preconditioning in accordance with JEDEC JESD22-A113F
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