Datasheet

DocID022152 Rev 8 141/202
STM32F405xx, STM32F407xx Electrical characteristics
Offset
(4)
Offset error
(difference between
measured value at Code
(0x800) and the ideal value
= V
REF+
/2)
-- ±10 mV
Given for the DAC in 12-bit
configuration
-- ±3 LSB
Given for the DAC in 10-bit at
V
REF+
= 3.6 V
-- ±12 LSB
Given for the DAC in 12-bit at
V
REF+
= 3.6 V
Gain
error
(4)
Gain error - - ±0.5 %
Given for the DAC in 12-bit
configuration
t
SETTLING
(4)
Settling time (full scale: for a
10-bit input code transition
between the lowest and the
highest input codes when
DAC_OUT reaches final
value ±4LSB
-3 6 µs
C
LOAD
≤ 50 pF,
R
LOAD
≥ 5 kΩ
THD
(4)
Total Harmonic Distortion
Buffer ON
-- - dB
C
LOAD
≤ 50 pF,
R
LOAD
≥ 5 kΩ
Update
rate
(2)
Max frequency for a correct
DAC_OUT change when
small variation in the input
code (from code i to i+1LSB)
-- 1 MS/s
C
LOAD
≤ 50 pF,
R
LOAD
≥ 5 kΩ
t
WAKEUP
(4)
Wakeup time from off state
(Setting the ENx bit in the
DAC Control register)
- 6.5 10 µs
C
LOAD
≤ 50 pF, R
LOAD
≥ 5 kΩ
input code between lowest and
highest possible ones.
PSRR+
(2)
Power supply rejection ratio
(to V
DDA
) (static DC
measurement)
- –67 –40 dB No R
LOAD
, C
LOAD
= 50 pF
1. V
DD
/V
DDA
minimum value of 1.7 V is obtained when the device operates in reduced temperature range, and with the use of
an external power supply supervisor (refer to Section : Internal reset OFF).
2. Guaranteed by design.
3. The quiescent mode corresponds to a state where the DAC maintains a stable output level to ensure that no dynamic
consumption occurs.
4. Guaranteed by characterization.
Table 74. DAC characteristics (continued)
Symbol Parameter Min Typ Max Unit Comments