Datasheet

QuickLogic EOS S3 Ultra Low Power multicore MCU datasheet - Version 3.3d 27-129
© 2020 QuickLogic Corporation
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Table 20: Power-On Sequence Timing Parameters
Letter Parameter Condition Min. Typ. Max. Unit
A AVDD Voltage Rising Time From 0 V to Target operating voltage See
Note
See
Note
See
Note
ms
B LDO_VIN/VDD1/VDD2 Rising
Time
From 0 V to Target operating voltage See
Note
See
Note
See
Note
ms
C VCCIOA/VCCIOB Rising Time From 0 V to Target operating voltage See
Note
See
Note
See
Note
µs
D Voltage Ready to SYS_RSTn
Release
All voltage rails at 90% voltage to
SYS_RSTn is released
300 µs
E SYS_RSTn Middle of the
Operation
SYS_RST_n assertion time 300 µs
F Voltage Ready to
HOST_SPI_Access Start
Register Read/Write access 500 ms
G System Reset Release to Chip
Exits Reset State
Chip ready 2 ms after SYS_RSTn
release
2 ms
H Bootstrap pins setup time Setup time with respect to SYS_RSTn 1 µs
I Bootstrap pins hold time Hold time with respect to SYS_RSTn 1 µs
J HSOSC Lock High-speed oscillator lock 500 1500
ms
SPI Burst SPI burst access 500 1500
ms
a. This is only required for a system that has intermittent power-down interruption. It is not required for AVDD always-on or
CMOS CLOCK always-on.
NOTE: For a system that has intermittent power up/down sequence, the AVDD rise time is recommended to be less than
100 µs. For more information, see Table 21.
NOTE: When using internal LDO for VDD, bring up AVDD, wait for LDO to ramp up to 90%, then bring up VCCIO. The
internal LDO starts to ramp up when the AVDD input reaches 1.5 V. The LDO takes up to 500 µS (max) to ramp up to 90%
of the target output level setting.
NOTE: Device initiation can begin after SYS_RSTn timing is met. SYS_RSTn signal is held low before power rails reach
90%. Initialization before SYS_RSTn timing is met can result in bootup failure. There is a weak pull-up inside SYS_RSTn,
see Table 35 for the resistance value.