User Manual

SAP1000 Active Probe User Manual
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6.2 Connecting the Probe to the Test Circuit
To maintain the high-performance capability of the probe in measurement
applications, care must be exercised in connecting the probe to the test circuit.
Increasing the parasitic capacitance or inductance in the input paths may
introduce a “ring” or slow the rise time of fast signals. Input leads which form a
large loop area will pick up any radiated electromagnetic field which passes
through the loop and may induce noise into the probe input.