Technical data

Copyright © Siemens AG 2013. All rights reserved. 40 EB 200P Manual
Technical data subject to change Version 1.0.1
Function F_XHIF(3)
F_XHIF(2) F_XHIF(1) F_XHIF(0)
XHIF=16bit, XHIF_XWR = R/W
Close Open x Close
XHIF=16bit, XHIF_XWR, XHIF_XWR
separated
Close Open x Open
XHIF=16bit, XHIF_XRDY active high
Close Open Open x
XHIF=16bit, XHIF_XRDY active low
Close Open Close x
XHIF=32bit, XHIF_XWR = R/W
Close Close x Close
XHIF=32bit, XHIF_XWR, XHIF_XWR
separated
Close Close x Open
XHIF=32bit, XHIF_XRDY active high
Close Close Open x
XHIF=32bit, XHIF_XRDY active low
Close Close Close x
XHIF=off
Remaining combinations
Table 35 EB 200P FPGA XHIF settings
Jumper configuration for enabling and disabling test and debug circuits is described in the following table.
Function Sync(0) Sync(1) Trace EEPROM
User GPIOs UART TEMP
No BNC connection
Open Open - -
- - -
Sync BNC Output
Open Close - -
- -
Sync BNC Input
Close Open - - - -
-
Wrong configuration
Close Close - - - -
-
Trace enabled
- - Open - - -
-
Trace disabled
- - Close - - -
-
I2C EEPROM disabled
- - - Open - - -
I2C EEPROM enabled
- - - Close - - -
User GPIOs disabled
- - - - Open - -
User GPIOs enabled
- - - - Close - -
UART disabled
- - - -
-
Open -
UART enabled
- - - -
-
Close -
SPI temperature sensor disabled
- - - -
- -
Open
SPI temperature sensor enabled
- - - -
- -
Close
Table 36 Test and debug circuits settings
Note: Enabled trace interface override FPGA XHIF settings and XHIF on FPGA is disabled (tri state)