Technical data

Technical data subject to change Version 1.0.1

5 Debug/ Boundary scan Interface

Several functions of the module can be performed with the JTAG interface of the EB 200P.

 Debugging of the EB 200P on connector X31 (see circuit 1)

 Boundary scan of all boundary scan-capable ICs on connector X31 (see circuit 1)

The debugging or boundary scan selection is specified with the ERTEC 200P input TAP SEL.

 TAP_SEL = Low  BS disable  Debugging selected.

 TAP_SEL = High  BS enable  Boundary scan selected.

Furthermore if one wants to use Boundary Scan, TACT pin of ERTEC must be set to log. “1”.

In addition to debugging the EB 200P, the integrated trace function of the ERTEC 200P can be used.

Various connectors are available for this purpose:

 X31 20-pin male connector according to stipulations of the ARM ETM9 macro cell for debug functionality

 X30 38-pin micro connector for debug and trace functions

The following companies have debuggers and trace modules for the ARM926EJ in their program:

 Amontec (JTAGkey, JTAGkey Tiny, etc.)

 Lauterbach (JTAG Debugger/Power Trace for ARM9)

 Hitex (Tanto for ARM, Tanto Trace Port)

 ARM (RealView ICE/Debugger)

 etc.

For a description of the ETM 9 Macro Cell, see /6/.

For a description of Multi ICE, see /7/.

For a description of the IEEE Standard Test and Boundary Scan, see /8/.