Technical data

Technical data subject to change Version 1.0.1

2.3 Test and debug peripherals

For easier development some test and debug circuits are assembled on board. Test and debug circuit can be

selectively connected to ERTEC 200P GPIOs. Configuration is done by jumpers and details about configuration are

described in chapter 6.13. All test and debug circuits are connected to GPIOs which are using 3.3V logic.

2.3.1 Status LEDs

Two groups of status LEDs are integrated on EB200P. The first group is near the bracket with small holes.

Figure 3 Status LEDs on the card bracket

The second group of LEDs is assembled on the EB200P top edge. The following table describes connection to

ERTEC 200P GPIOs. LEDs are not powered directly from GPIOs but via buffers at 3.3V .