Technical data

5 JTAG Interface

Several functions of the module can be performed with the JTAG interface of the EB 200.

 Debugging of the EB 200 on connector X61 (see circuit 1)

 Boundary scan of all boundary scan-capable ICs on connector X61 (see circuit 1)

The debugging

or boundary scan selection is specified with the ERTEC 200 input TAP SEL.

 TAP_SEL = High  BS disable  Debugging selected.

 TAP_SEL = Low  BS enable  Boundary scan selected.

In addition to debugging the EB 200, the integrated trace function of the ERTEC 200 can be used.

Various connectors are available for this purpose:

 X61 20-pin male connector according to stipulations of the ARM ETM9 macro cell for debug functionality

 X60 38-pin micro connector for debug and trace functions

The following settings are required on connector X10 and X11.

 The ETM9 module must be enabled CONFIG[6,5,2] = 101 b (see Section 2.1.2).



Pin EN_TRACE_GPIO_N = High with SYS_CONFIG[1:0] = 01 b (see Section 2.1.2)

 This separates the trace port from the remaining logic by means of bus switches D4 and D5.

The following companies have debuggers and trace modules for the ARM946E in their program:

 Lauterbach (JTAG Debugger/Power Trace for ARM9)

 Hitex (Tanto for ARM, Tanto Trace Port)

 ARM (RealView ICE/Debugger)

 etc.

For a description of the ETM 9 Macro Cell, see /6/.

For a description of Multi ICE, see /7/.

For a description of the IEEE Standard Test and Boundary Scan, see /8/.

Note: On X61 (JTAG-Interface) DBGRQ (Pin17) and DBGACK (Pin19) are dafault not used (see 7.9). The Signal

„DBGACK“ is not connected to X61 Pin19. Wrongly the Signal „ETMEXTIN1“ is connected to X61 Pin19. If you

need the DBGACK functionality you must change the signal connection on your EB200.

Technical data subject to change Version 1.1.4