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Table Of Contents
SARA-R4 series-AT commands manual
UBX-17003787 - R16
14System features
Page 171 of 401
Parameter Type Description
o 1: "high" logic digital level measured at the module pin
[<bit_
padding>]<pin_seq>
Number Sequence of hexadecimal digits containing the pin information and the action to
execute:
• SARA-R4 / SARA-N4 - See the Notes and the SARA-R4 application development
guide, [177] for detailed number description
14.4.10Notes
• Consider these steps to construct the [<bit_padding>]<pin_seq> sequence:
o Consider the total number of the module's pins available
- SARA-R4 / SARA-N4 - 96 pins
o When a non-testable pin is selected, the command does not return an error result code but the value is
not considered and not applied.
o The status of the n-th pin will be represented by the corresponding n-th bit; see the <op_code>
description for the notation of each mode setting
o Convert each group of four binary digits into its hexadecimal representation
SARA-R4 / SARA-N4
See the SARA-R4 application development guide [177] and the corresponding module data sheet
for the list of pins available for testing and their levels characteristics and further test command
examples.
SARA-R4 / SARA-N4
•
Command Response Description
Configure the formatting of the error result code by
means of +CMEE AT command
AT+COPS=2 OK Deregister the module from the network
AT+UTEST=1 OK The module enters the test mode
AT+UTEST=10,1 (pin description)
OK
Gets the pin information
AT+UTEST=10,2,"0000000000
01fa1e01c49fe0"
OK The command puts the module in Interface initialised
state; the command saves the pins status to restore it
at the end of the test.
Pins enabled for testing: DSR, RI, DCD, DTR, RTS, CTS,
TXD, RXD, GPIO1, GPIO6, GPIO2, GPIO3, GPIO4, I2S_WA/
SPI_MOSI, I2S_TXD/SPI_CS, I2S_CLK/SPI_CLK, I2S_
RXD/SPI_MISO, GPIO5, SDIO_D2, SDIO_CLK, SDIO_CMD,
SDIO_D0, SDIO_D3, SDIO_D1
AT+UTEST=10,3,"0000000000
01f81e00801fe0"
OK Pins configuration:
o DSR, RI, DCD, DTR, RTS, CTS, TXD, RXD, GPIO3,
I2S_WA/SPI_MOSI, I2S_TXD/SPI_CS, I2S_CLK/SPI_
CLK, I2S_RXD/SPI_MISO, SDIO_D2, SDIO_CLK, SDIO_
CMD, SDIO_D0, SDIO_D3, SDIO_D1 as input.
o GPIO1, GPIO6, GPIO2, GPIO4, GPIO5 as output.
AT+UTEST=10,4,"0000000000
00020000448000"
OK Digital logic value of the output pins:
o GPIO1, GPIO6, GPIO2, GPIO5 set to "high".
AT+UTEST=10,5 OK Configurations made by AT+UTEST=10,2; AT+UTEST=
10,3 and AT+UTEST=10,4 are executed.
AT+UTEST=10,6 000000000000020000
c48b00
OK
Logic digital value measured at modules pins:
o DTR, RTS, TXD, GPIO1, GPIO6, GPIO2, GPIO3, GPIO5:
"high" level detected.
AT+UTEST=0 OK Module exits from the test mode and normal pin
configuration is restored.
Table 13: Digital pins test command examples
The digital pins can be configured as many times as needed by the testing process; AT+UTEST=10,2
command is not needed any more as the DUT is already in Interface initialized state.
• The UART pins must be tested using a terminal program connected via the USB interface (not UART).