User Manual

SARA-R4 series-AT commands manual
UBX-17003787 - R16
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14System features
Page 169 of 401
Command Response Description
AT+UTEST=3,32,7,5 +UTEST: 32,7,5,1,1000
OK
The module will transmit for 1 s interval 1
slot burst sequence at TX channel 32 GSM
900 at PCL 5 using training sequence 5
and normal GMSK modulation.
AT+UTEST=3,65,8,,2,5000 +UTEST: 65,8,5,2,5000
OK
The module will transmit for 5 s interval 1
slot burst sequence at TX channel 65 GSM
900 at PCL 8 (gamma 6, 27 dBm) using
training sequence 5 and normal 8-PSK
modulation.
AT+UTEST=3,660,,,,0 +UTEST: 660,5,5,1,0
OK
The module will transmit continuously 1
slot burst sequence at TX channel 660
DCS 1800 at PCL 5 using training sequence
5 and normal GMSK modulation.
AT+UTEST=3,9612,22,,,2000 +UTEST: 9612,22,5,1,2000
OK
The module will transmit for 2 s interval at
TX channel 9612 band B1 at 22 dBm power
level using WCDMA modulation.
AT+UTEST=3,120399,15,,,3000 +UTEST: 120399,15,5,1,3000
OK
The module transmits for 3 s interval
at TX channel 20399 band FDD 4 at 15
dBm power level using SC-FDMA OFDM
modulation 5 MHz bandwidth.
AT+UTEST=3,123230,-10,,,0 +UTEST: 123230,-10,5,1,0
OK
The module continuously transmits at
TX channel 23230 band FDD 13 at -10
dBm power level using SC-FDMA OFDM
modulation 5 MHz bandwidth.
Table 12: TX mode test command examples
14.4.7Digital pins testing description
Defines the commands to perform some verifications on all the digital pins of the u-blox cellular modules.
These pins can be considered as generic digital input / output pins; it is possible to configure one pin as a digital
output with "high" logic level and then verify the voltage level present. Conversely, it is possible set a pin as
a digital input, externally apply a "high" or "low" logic level and then check if the module is able to correctly
measure the voltage level applied.
After the execution of the AT+UTEST=10,5 command, it is possible to externally apply a voltage level to the
enabled input pins and / or measure the voltage level on the pins configured as digital input.
These commands are intended for production to check the correct digital pins behavior, detect possible
soldering or functional problems and can be executed only in non-signalling mode (otherwise the "+CME
ERROR: operation not allowed" or "+CME ERROR: 3" error result code - depending on the +CMEE AT
command setting - is issued without performing any operations).
Do not exceed the values reported in the Generic Digital Interface section of the module data sheet
when testing a pin as a digital input pin, since stressing the device above the listed ratings may cause a
permanent damage of the module.
The <op_code>, <bit_padding>, <pin_seq> parameters setting is not stored in the NVM.
SARA-R4 / SARA-N4
See the SARA-R4 application development guide [177] and the corresponding module data sheet for the
list of pins available for testing and their levels characteristics and further test command examples.
14.4.8Syntax
Type Syntax Response Example
Digital pins testing generic syntax
Set AT+UTEST=10,<op_code>[,[<bit_
padding>]<pin_seq>]
OK AT+UTEST=10,3,"0000001000000
300"
OK
Original configuration restoring
Set AT+UTEST=10,0 OK AT+UTEST=10,0