User Manual

SARK-110-ULM User’s Manual

Rev 1.0 June 22

After some seconds the results are

shown on the screen.

The figure below describes the measured parameters:

Series resonant frequency

Parallel resonant frequency

Quality factor

Rs: motional (series) resistance

Co: parallel capacitance

Entry number in the file

File name

Ls: motional (series) inductance

Cs: motional (series) capacitance

The process starts by searching for the series and parallel resonant frequencies. The start scan

frequency is taken from the specified frequency value.

The resonant frequencies are identified in the singularities where the impedance changes from

pure capacitive (phase value close to -90º) to pure inductive (phase value close to +90º). The

resonant frequencies are then obtained from the frequency points where the measured phase

value is close to zero.

After determining the series and parallel resonant frequencies, the series resistance (Rs) at the

series resonant frequency is measured. Then the parallel capacitance (Co) is measured. This

value is measured from a frequency that is 2.5 MHz below Fs and 2.5 MHz above Fp. From

these measurements, the rest of the parameters are derived:

The value of series capacitance (Cs) is given by:













−= 12

CoCs

The value of the series inductance (Ls) is given by:

( )

CsFs





Finally, the quality factor of the crystal (Q) is calculated by:

Q =