Datasheet

DocID17530 Rev 2 11/54
LIS3DH Mechanical and electrical specifications
54
TCOff
Zero-
g level change
vs temperature
Max delta from 25 °C ±0.5 m
g/°C
An
Acceleration noise
density
FS bit set to 00, High-Resolution mode
(Table 10), ODR > 1300 Hz
220 μg/√Hz
Vst
Self-test
output change
(5)(6)(7)
FS bit set to 00
X-axis; Normal mode
17 360 LSb
FS bit set to 00
Y-axis; Normal mode
17 360 LSb
FS bit set to 00
Z-axis; Normal mode
17 360 LSb
Top
Operating
temperature range
-40 +85 °C
1. Typical specifications are not guaranteed.
2. Verified by wafer level test and measurement of initial offset and sensitivity.
3. Typical zero-g level offset value after MSL3 preconditioning.
4. Offset can be eliminated by enabling the built-in high-pass filter.
5. The sign of “Self-test output change” is defined by the ST bits in CTRL_REG4 (23h), for all axes.
6.
“Self-test output change” is defined as the absolute value of:
OUTPUT[LSb]
(Self test enabled)
- OUTPUT[LSb]
(Self test disabled)
. 1LSb = 4 mg at 10-bit representation, ±2 g full scale.
7. After enabling the self-test, correct data is obtained after two samples (low-power mode / normal mode) or after eight
samples (high-resolution mode).
Table 4. Mechanical characteristics
Symbol Parameter Test conditions Min. Typ.
(1)
Max. Unit