User Manual

SCSI Commands Reference Manual, Rev. J 333
www.seagate.com Parameters for direct access devices
5.2.11.3 Grown Defects During Certification log parameter
The Grown Defects During Certification log parameter for the Format Status log page has the format defined in table 306.
PARAMETER CODE field
The PARAMETER CODE field is described in 4.2.2.2.2 and shall be set to the value shown in table 306 for the Grown Defects During Certification
log parameter.
TSD bit
The target save disable (TSD) bit (see SPC-5) shall be set to zero for the Grown Defects During Certification log parameter, indicating that the
logical unit saves the Grown Defects During Certification log parameter at vendor specific intervals without any request from an application cli
-
ent.
PARAMETER LENGTH field
The PARAMETER LENGTH field is described in SPC-5 and shall be set to the value shown in table 306 for the Grown Defects During Certification
log parameter.
GROWN DEFECTS DURING CERTIFICATION field
After a successful format operation during which certification was performed, the GROWN DEFECTS DURING CERTIFICATION field shall indicate
the number of defects detected as a result of performing the certification. The value in the GROWN DEFECTS DURING CERTIFICATION field
count reflects only those defects detected and replaced during the successful format operation that were not already part of the PLIST or GLIST.
After a successful format operation during which certification was not performed, the GROWN DEFECTS DURING CERTIFICATION field shall be
set to zero.
Table 306 Grown Defects During Certification log parameter format
Bit
Byte
7 6 5 4 3 2 1 0
0
(MSB)
PARAMETER CODE (0001h)
1
(LSB)
2
PARAMETER CONTROL BYTE – binary format list log parameter (see 5.2.2.2.2.5)
3
PARAMETER LENGTH (08h)
4
(MSB)
GROWN DEFECTS DURING CERTIFICATION
. . .
n
(LSB)