Specifications

New Test Patterns Available on 2012 Echo-P and X10 Plus Chipsets
continued
Using Test Patterns for Troubleshooting
You can use the test patterns to isolate the defect to a particular component. See the table below
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Page 3
Volume 7, Issue 11 Consumer Electronics Newsletter Samsung Tech Talk
Main Board
Test Pattern Display
T-Con/Logic Board
Test Pattern Display
Possible Cause
Of Problem
OK OK Source
NG OK Main Board or LVDS Cable
NG NG T-Con/Logic or Panel