Datasheet
- 30 -
MMCRE64G5MXP-0VB datasheet SSD
Rev. 1.3
MMCRE28G5MXP-0VB
MMDOE56G5MXP-0VB
7.3.6 1 Self-test log structure
The following defines the 512 bytes that make up the Self-test log sector.
[Table 7.8] Self-test log data structure
NOTE :
N is 0 through 20
The data structure contains the descriptor of the Self-test that the device has performed. Each descriptor is 24 bytes long and the self-test data structure
is capable to contain up to 21 descriptors. After 21 descriptors has been recorded, the oldest descriptor will be overwritten with the new descriptor. The
self-test log pointer points to the most recent descriptor. When there is no descriptor, the value is 0. When there are descriptor(s), the value is 1 through
21.
7.3.7 1 Selective self-test log data structure
The Selective self-test log is a log that may be both written and read by the host. This log allows the host to select the parameters for the self-test and to
monitor the progress of the self-test. The following table defines the contents of the Selective self-test log which is 512 bytes long. All multi-byte fields
shown in these data structures follow the specifications for byte ordering.
Byte Byte
0~1 Data structure revision
n*24+2 Self-test number
n*24+3 Self-test execution status
n*24+4~n*24+5 Life timestamp
n*24+6 Self-test failure check point
n*24+7~n*24+10 LBA of first failure
n*24+11~n*24+25 Vendor specific
... ...
506~507 Vendor specific
508 Self-test log pointer
509~510 Reserved
511 Data structure checksum
Byte Description Read/Write
0-1 Data structure revision R/W
2-9 Starting LBA for test span 1 R/W
10-17 Ending LBA for test span 1 R/W
18-25 Starting LBA for test span 2 R/W
26-33 Ending LBA for test span 2 R/W
34-41 Starting LBA for test span 3 R/W
42-49 Ending LBA for test span 3 R/W
50-57 Starting LBA for test span 4 R/W
58-65 Ending LBA for test span 4+ R/W
66-73 Starting LBA for test span 5 R/W
74-81 Ending LBA for test span 5 R/W
82-337 Reserved Reserved
338-491 Vendor specific Vendor specific
492-499 Current LBA under test Read
500-501 Current span under test Read
502-503 Feature flags R/W
504-507 Vendor Specific Vendor specific
508-509 Selective self test pending time R/W
510 Reserved Reserved
511 Data structure checksum R/W