Specifications
Samsung MFP Security Kit Type_B V1.5 Security Target
73
Copyright
2010 Samsung Electronics Co., Ltd., All rights reserved
ATE_DPT.1.1D The developer shall provide the analysis of the
depth of testing.
Content and presentation elements:
ATE_DPT.1.1C The analysis of the depth of testing shall
demonstrate the correspondence between the
tests in the test documentation and the TSF
subsystems in the TOE design.
ATE_DPT.1.2C The analysis of the depth of testing shall
demonstrate that all TSF subsystems in the TOE
design have been tested.
Evaluator action elements:
ATE_DPT.1.1E The evaluator shall confirm that the information
provided meets all requirements for content and
presentation of evidence.
5.2.5.3 ATE_FUN.1 Functional testing
Dependencies: ATE_COV.1 Evidence of coverage
Developer action elements:
ATE_FUN.1.1D The developer shall test the TSF and document
the results.
ATE_FUN.1.2D The developer shall provide test documentation.
Content and presentation elements:
ATE_FUN.1.1C The test documentation shall consist of test plans,
expected test results and actual test results.
ATE_FUN.1.2C The test plans shall identify the tests to be
performed and describe the scenarios for
performing each test. These scenarios shall
include any ordering dependencies on the results
of other tests.
ATE_FUN.1.3C The expected test results shall show the
anticipated output from a successful execution of
the tests.
ATE_FUN.1.4C The actual test results shall be consistent with the
expected test results.
Evaluator action elements:
ATE_FUN.1.1E The evaluator shall confirm that the information
provided meets all requirements for content and
presentation of evidence.










