Specifications

4-12 Samsung Electronics
Alignment and Adjustments
3. IC (INTEGRATED CIRCUIT)
IC has built in DIODE against overvoltage in PIN. Generally, except for internal circuit defects, IC defects
can be found, by measuring the DIODE.
Defects have SHORT(0 ohm) for both forward and reverse direction.
Hundreds of ohms
Forward Direction
Reverse Direction
Varying depending on IC but generally normal
Infinity in DIODE TEST MODE