Brochure

12
Spectrum analysis:
identify interactions
between time and
frequency
Parallel operation: correlation between frequency
and time
Advanced electronics is based on the seamless interaction
between protocol-based interfaces, digital, analog and fre-
quency components. Simultaneous analysis of all compo-
nents is a must. Time, frequency and protocol information
are correlated, and time references can be quickly recog-
nized. Measurement windows help you select specific
areas of the recording, which can simplify, for example,
the acquisition of frequency switching operations.
Spectrogram: display of frequency over time
A spectrogram displays the spectrum of frequencies as
they vary over time. For easy interpretation, the magnitude
can be color-coded. Thanks to the high FFT rate, even fast
frequency changes can be displayed. When used in com-
bination with the R&S®RTM-K15 history and segmented
memory option, the spectrogram marker shows the time
of the acquisition and makes it possible to load the corre-
sponding time and frequency waveforms onto the screen.
All R&S®RTM3000 tools can be used to analyze the loaded
waveforms.
Markers: find peaks automatically
Markers can be automatically positioned on the frequency
peaks for fast analysis. An adaptable threshold defines the
peaks. Parameters such as excursion and maximum peak
width can be adjusted for in-depth analysis. Results can be
compiled in a table (absolute or relative to a specific refer-
ence marker). Selectable delta measurements make it easy
to adjust the distances between signal peaks.
Test signal from three different
perspectives: time domain (top),
spectrogram (center) and frequen-
cy domain (bottom).
Spectrogram: evolution over time
Peak markers: automatic positioning
Fast and precise analysis
Difficult-to-find faults often result from the interaction
between time and frequency signals. The R&S®RTM-K18
spectrum analysis and spectrogram option quickly finds
such errors. Like on a spectrum analyzer, parameters
such as center frequency and resolution bandwidth can
be adapted to the specific measurement task. The oscil-
loscope automatically selects the relevant time domain
settings. Optimum performance ensures the fastest multi-
domain analysis in this oscilloscope class.
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