User Manual

228 Rockwell Automation Publication 193-UM002I-EN-P - December 2011
Appendix A Specifications
➊Performance Criteria 1 requires the DUT to experience no degradation or loss of performance.
➋Environment 2.
Functionality
Specifications
Surge Immunity
Test Level:
Performance Criteria:
2kV (L-E)
1kV (L-L)
1 ➊➋
Radiated Emissions Class A
Conducted Emissions Class A
Table A.1 Electromagnetic Compatibility Specifications
Table 21: DeviceNet Communications
Baud Rate 125 k, 250 k, 500 k
Auto-Baud Rate Identification Yes
“Group 2 – Slave Only” device type Yes
Polled I/O Messaging Yes
Change of State Messaging Yes
Cyclic Messaging Yes
Explicit Messaging Yes
Full Parameter Object Support Yes
Group 4 – Off-Line Node Recovery Messaging Yes
Configuring Consistency Value Yes
Unconnected Messaging Manager (UCMM) Yes