Datasheet
Ceramic Disk Capacitors
5.0 Specification 
No  Item  Class I  Class II  Class III  Measuring Condition 
10 
Resistance 
to 
Soldering 
heat
C
 2.5﹪or  0.25pF
Whichever is greater
Y5P: 5﹪ 
Z5U: 15﹪ 
Z5V: 20﹪ 
 Y5P :  ±  7.5% 
The lead wire is immersed in the melted 
solder 1.5mm to 2mm from the capacitor 
body 
  (Class I, II) 
Solder temperature:350  10℃ 
Duration:3  0.5sec. 
  (Class III) 
Solder temperature:260  5℃ 
Duration:5  0.5sec. 
The measurements after testing must be 
taken after leaving the sample for 12 to 
24 hours under normal temperature and 
humidity conditions. 
Withstanding 
voltage 
No defects 
Exterior  No abnormalities 
11 
Temperature
and 
Immersion 
cycling 
C
 5﹪or  0.5pF
Whichever is greater
 Y5P :  ±  15 % 
Fix the capacitor to the supporting jig in 
the same manner and under the same 
conditions as (10). Perform the 5 cycles 
according to the four heat treatments 
listed in the following table. 
Q╱D.F. 
C≧30pF:Q≧350 
10pF>C<30pF: 
Q≧275 +
2
5
× C 
C≦10pF:Q≧200 + 10 × C 
(C is nominal capacitance) 
Y5P &Z5U: 
tanδ ≦0.05 
Z5V: 
tanδ ≦0.075 
Y5P:tanδ ≦0.05 
I.R.
More than 1GΩ
More than 1GΩ or 20M Ω 
‧F,whichever is less. 
More than 500MΩ or 10M Ω 
‧F,whichever is less. 
Withstanding 
voltage 
No defects 
Exterior  No abnormalities 
12 
Humidity 
Loading 
C
 7.5﹪or  0.75pF
Whichever is greater
Y5P: 10﹪ 
Z5U: 20﹪
Z5V: 30﹪ 
 Y5P :  ±  15 % 
Temperature:40  2℃ 
Humidity:90 to 95﹪R.H. 
Duration:500 
0
24
 hrs. 
The rated voltage continuously applied. 
The  chargedischarge  current  is  less 
than 10mA. 
The  measurements  after  testing 
must be taken  after  leaving  the 
sample  for  1 to 2 hours under normal 
temperature  and humidity conditions. 
 Perform a heat treatment at 40  2℃
for 1 hour. Remove and let sit for 1 to 2 
hours at normal temperature and 
humidity conditions. Perform the initial 
measurement.
Q╱D.F. 
C≧30pF:Q≧200 
C<30pF: 
Q≧100 +
3
10
× C 
(C is nominal capacitance)
Y5P &Z5U: 
tanδ ≦0.05 
Z5V: 
tanδ ≦0.075 
Y5P: tanδ 
≦0.075 
I.R.
More than 1GΩ
More than 1GΩ or 20M Ω ‧
F,whichever is less. 
More than 500MΩ or 10M Ω 
‧F,whichever is less. 
Withstanding 
voltage 
No defects 
Exterior  No abnormalities 
Step 1 2 3 4
Temp.
(℃)
Min.
Operating
Temp.
Room
Temp.
Max.
Operating
Temp.
Room
Temp.
Time
(min.)
303 15 303 15
The measurements after testing must be 
taken after leaving the sample for 12 to 
24 hours under normal temperature and 
humidity conditions. 
Y5P: 10﹪
Z5U: 20﹪
Z5V: 30﹪
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