Datasheet

9
RIGOL
Hardware Full Memory Auto Measurement
Histogram Analysis
Hardware Pass/Fail Test
Enhanced FFT Analysis
The MSO7000/DS7000 series supports the histogram analysis
function, available to provide the horizontal waveform histogram,
vertical waveform histogram, and measurement histogram.
The horizontal waveform histogram is applicable for observing
the number of jitters and jitter distribution of the clock signal;
the vertical waveform histogram is applicable for observing the
noise distribution of the signal; and measurement histogram is
applicable for observing the distribution of the measurement
results of the signal under test over a long period of time to help
users quickly find out the potential abnormalities of the signal.
The MSO7000/DS7000 series is equipped with hardware pass/
fail test function as the standard configuration, which can be
used in signal monitoring for a long time, signal monitoring
during design, and signal test in the production line. You can
set the test mask based on the known "standard" waveform,
and then compare the signal under test with the "standard"
waveform to display the statistics on the test results. When a
successful or failed test is detected by the oscilloscope, you can
choose to immediately stop monitoring, enable the beeper to
sound an alarm, or save the current screen image. Also, you can
choose to continue monitoring.
The MSO7000/DS7000 series can analyze 1 Mpts of FFTs,
which improves the frequency resolution to a large extent,
convenient for you to better analyze the disturbance noise in
the circuit under test. To adjust the spectrum waveforms to
be observed, set the center frequency and the span; or set
the start frequency and the stop frequency. The MSO7000/
DS7000 series also provides the peak search function, which
can auto mark up to 11 peaks and display their frequencies and
amplitudes in the form of a list. Such information and the non-
peak section in the frequency-domain cursor measurement can
greatly improve the working efficiency of the engineers.
Histogram of Horizontal Waveforms
The Pass/Fail test function can quickly make a statistics on the occurrence
probability of the signal exceptions.
With the near-field probe, you can easily observe
the spectrum peak in the frequency domain when
the probe approaches to the radiation leakage point.