Datasheet
SFDR & SINAD
[1]
Measuring Characteristics
Function
DCV
DCI
DC Voltage
Input Resistance
Input Protection
Input Offset Current
CMRR (common mode rejection ratio)
Resistance
Measurement Method
Open-circuit Voltage
Max. Lead Resistance (4-wire)
Input Protection
Offset Compensation
DC Current
Shunt Resistor
Input Protection
Continuity/Diode Test
Response Time
Continuity Threshold
Autozero OFF Operation (typical value)
Following instrument warm-up at the environment temperature ±1
℃
and <5 minutes,
add 0.0001 % range + 2 uV for DCV and 2 mΩ for resistance.
Settling Time Considerations
Reading settling times are affected by source impedance, cable dielectric characteristics and input signal changes. The default
measurement delay is selected to give rst reading right for most measurements.
Measurement Considerations
Telon or other high-impedance, low-dielectric absorption wire insulation is recommended for these measurements.
300 samples/sec, with audible tone
Adjustable from 1 Ω to 2000 Ω
200 mV, 2 V, 20 V ranges: Selectable 10 MΩ or > 10 GΩ
(For these ranges, input beyond ±26V are clamped through 106 kΩ (typical)
200 V and 1000 V ranges: 10 MΩ ± 1%
1000 V
50 pA, at 25
℃
, typical
140 dB for 1 kΩ unbalance in LO lead, ± 500 VDC peak maximum
Selectable 4-wire or 2-wire resistance
Current source referenced to LO input
Limited to < 10V
10% of range per lead for 200 Ω, 2 kΩ ranges, 1 kΩ per lead on all other ranges
1000 V on all ranges
Available on 200 Ω, 2kΩ and 20 kΩ ranges
100 Ω for 200 uA, 2 mA
1 Ω for 20 mA , 200 mA
0.01 Ω for 2 A, 10 A
Externally accessible 500 mA, 250 V fast blow fuse at the rear panel for 200 uA, 2 mA,
20 mA and 200 mA ranges.
Internal 10 A, 250 V slow blow fuse for 2 A and 10 A ranges
Range
200 mV
2 V
20 V
200 V
1000 V
200 uA
2 mA
20 mA
200 mA
2 A
Spurious-Free Dynamic Range (SFDR)
81
79
79
83
86
89
86
88
81
69
Signal-to-Noise-and-Distortion (SINAD)
76
78
75
80
82
69
81
69
79
64
[1] Typical value. -1dBFS, 1kHz single tone. 100 us aperture time, zero trigger delay, auto zero off and 4096 samples.