Datasheet
Measurement Rate
Other Measurement Characteristics
Function
DC Voltage
DC Current
2 - wire Resistance
4 - wire Resistance
AC Voltage
AC Current
[2]
Frequency and Period
[4]
Capacitance
[5]
Triggering and Storage
Trigger
Time Base Resolution
Trigger Delay
Sample Timer
Internal Trigger Level Accuracy
Reading Hold Sensitivity
Single Trigger Samples
External Trigger Input
VMC Output
History Record and Storage
Nonvolatile Memory
Non-volatile Memory
Pre-trigger or Pos-trigger, Internal Trigger or External Trigger, Rising Edge Trigger or Falling Edge Trigger
33.333 us, 0.01% Accuracy
0 to 3600 s available (about 33 μs step size)
0 to 3600 s available (about 33 μs step size)
± 1% of range
0.01%, 0.1%, 1% or 10% of reading
1 to 50000
Level: 5 V TTL compatible
Impedance: > 30 kΩ in parallel with 500 pF
Delay: < 50 μs
Jitter: < 50 μs (ACV, ACI, FREQ and PREIOD < 2ms)
Polarity: selectable rising edge or falling edge
Maximum Rate: 300/s
Minimum Pulse Width: 2 μs
Level: 5 V TTL compatible
Output Impedance: 100 Ω, typical
Output Polarity: Falling Edge
Pulse Width: about 2μs
512 k reading history data record
10 sets history data storage (5000 readings/group)
5 sets sensor data storage (5000 readings/group)
10 sets instrument setup storage
5 sets Anysensor setup storage
Support USB ash device backup data and setting.
Setting
0.006 NPLC Integration Time
0.02 NPLC
0.06 NPLC
0.2 NPLC
1 NPLC
2 NPLC
10 NPLC
100 NPLC
3 Hz AC Filter
20 Hz
200 Hz
200 Hz
1 s Gate Time
0.1 s
0.01 s
0.001 s
Integration Time
100 (100) us
400 (333) us
1.2 (1) ms
4 (3.33) ms
20 (16.7) ms
40 (33.3) ms
200 (167) ms
2 (1.67) s
Readings/s 50Hz (60Hz)
10000 (10000)
2500 (3000)
833 (1000)
250 (300)
50 (60)
25 (30)
5 (6)
0.5 (0.6)
0.2
1.5
10
50
[3]
1
10
80
500
25
[1] Auto trigger, zero trigger delay, auto zero off, auto range off, math function
off and external interface off.
[2] Use the default trigger delay setting.
[3] The maximum rate available when trigger delay is set to 0.
[4] 20 V range, fast lter, 1kHz input.
[5] Measure 20 nF capacitance on 200 nF range. The measurement period
changes with the capacitance under test. The maximum measurement
period on 100mF is 4 s (typical value).










