Specifications

Chapter 3 Performance Test RIGOL
Service Guide for DM3058
3-5
Verification Testing
Zero Offset Test
This test is used to inspect the performance of zero offset of the device, and which is
required only when regular offsets happened to function or range.
Verification procedure:
1. Read “Testing Conditions” carefully before start.
2. Short-circuit the Input HI-LO and Sense HI-LO using 4-terminal shortcircuiter and
open circuit of input terminal of current, see as Figure 3-1.
3. Test the functions and ranges listed in Table 3-2 item by item. And then set the
rate of reading as “Slow” and disable all the math operations.
4. Compare the testing results with the test limits listed in table.
Figure 3-1 The Input HI-LO and Sense/Ref HI-LO Terminals in Short Circuit
Table 3-2 Zero Offset of the Standard Equipment
Function
[1]
Range
Input
signal
Quick
Test
Test limits (1 year)
Upper
limit
Lower
limit
DC Voltage
200.000 mV
short
Q
8 μV
-8 μV
2.00000 V
short
60 μV
-60 μV
20.0000 V
short
800 μV
-800μ V
200.000 V
short
6 mV
-6 mV
1000.00 V
short
30 mV
-30 mV
DC Current
200.000 μA
open
Q
10 nA
-10 nA
2.00000 mA
open
100 nA
-100 nA
20.0000 mA
open
Q
4 μA
-4 μA
200.000 mA
open
16 μA
-16 μA
2.00000 A
open
400 μA
-400 μA
10.0000 A
open
1 mA
-1 mA