RJH60F7BDPQ-A0 Preliminary
R07DS0633EJ0100 Rev.1.00 Page 7 of 8
Feb 17, 2012
Diode Reverse Recovery Time Test Circuit Waveform
D.U.T
V
CC
t
rr
I
rr
d
is
/d
t
0.9 I
rr
I
S
I
S
Rg
0.5 I
rr
L
0
Switching Time Test Circuit Waveform
Diode clamp
D.U.T
Rg
L
V
CC
t
d(off)
t
off
t
on
t
d(on)
t
f
t
r
t
tail
90%
90%90%
10%
10%
10%
10%
1%
V
GE
I
C
V
CE
